Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Selvamanickam V., Chen Y., Salagaj T., Zhang E., Lensetha K.
Ключевые слова: presentation, HTS, YBCO, coated conductors, critical caracteristics, critical current, magnetic field dependence, design parameters, bending process, mechanical properties, stress effects, stabilizing layers, overcurrent, dielectric properties, breakdown characteristics, ac losses, joints, current-voltage characteristics, coated conductors multifilamentary, twisting, twist-pitch, experimental results
Ключевые слова: HTS, YBCO, coated conductors, buffer layers, texture, IBAD process, patents, fabrication
Ключевые слова: patents, HTS, coated conductors, substrate metallic, reel-to-reel process, polishing process, fabrication, mechanical treatment
Ключевые слова: patents, HTS, coated conductors, buffer layers, IBAD process, processing apparatus, design, fabrication
Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Knoll A., Lenseth K., Selvamanickam V., Chen Y., Salagaj T., Hazelton D., Reis C., Yumura H., Weber C.
Iwasa Y., Selvamanickam V., Lee H., Hahn S.-Y., Bascunan J., Jankowski J., Reeves J.(jreeves@igc.com), Knoll A.(aknoll@igc.com), Xie Y.-Y.(yxie@igc.com)
Ключевые слова: HTS, YBCO, coated conductors, stability, quench protection, test results
Ekin J.W., Li Y., Xiong X., Qiao Y., Reeves J., Knoll A., Lenseth K., Iwasa Y., Civale L., Maiorov B., Suenaga M., Selvamanickam V., Cheggour N., Chen Y., Salagaj T., Weber C., Xie Y.-Y.(yxie@igc.com), Solovyov V., Clickner C., Hou P.
Cheggour N.(cheggour@boulder.nist.gov), Ekin J.W., Feenstra R., Xie Y., Selvamanickam V., Thieme C.L.H.
Ключевые слова: HTS, YBCO, coated conductors, stabilizing layers, substrate Hastelloy, IBAD process, MOCVD process, electroplating process, substrate Ni-W, RABITS process, MOD process, laminations, strain effects, critical current, critical current density, n-value, experimental results, critical caracteristics, fabrication, mechanical properties
Selvamanickam V.(selva@igc.com), Lee H.G., Li Y., Xiong X., Qiao Y., Reeves J., Xie Y., Knoll A., Lenseth K.
Selvamanickam V., Hatzistergos M.S., Efstathiadis H.(hefstathiadis@uamail.albany.edu), Lifshin E., Kaloyeros A.E., Reeves J.L., Allen L.P.(lallen@epion.com), MacCrimmon R.
Ключевые слова: HTS, YBCO, coated conductors, substrate SrTiO3, MOCVD process, microstructure, critical current density, critical caracteristics, fabrication
Li Y., Qiao Y., Reeves J., Lenseth K., Selvamanickam V., Lee H.-., Xie Y.Y., Carota G., Funk M., Zdun K., Xie J., Likes K., Jones M., Hope L., Hazelton D.W.
Ключевые слова: HTS, coated conductors, YBCO, substrate Ni, IBAD process, PLD process, MOCVD process, fabrication
Qiao Y., Reeves J., Lenseth K., Selvamanickam V., Zdun K., Xie J., Hope L., Yijie L.(yli@igc.com), Corcoran S.
Ключевые слова: HTS, YBCO, coated conductors, PLD process, reel-to-reel process, microstructure, critical current density, fabrication, critical caracteristics
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